VLSI Design and implementation of Built in Self Test
MODULE 1: Design of Test Pattern Generator (TPG)
DESCRIPTION:
The
test pattern generation is the basic module for Analog built-in
self-test(BIST).In the proposed system a Built in self test is performed using
a sample module which is nothing but a random access memory(RAM) is designed.
The BIST RAM is considered under test and difference advanced test cases are
given to test the circuit. We are using the test pattern generator for applying
the proper test cases to the BIST RAM.
MODULE 2: Design of control unit
DESCRIPTION:
This module is implemented for
controlling the overall operations in the RAM built-in self-test. The
control unit makes the control over the writing, reading, addressing and
comparison etc. in the built-in self-test. Moreover the control unit will take
the decision about the process in the BIST.In this way improves the efficiency.
MODULE 3: Design of
Test
Pattern Recorder (TPR)
DESCRIPTION:
In the
RAM built-in self-test, the input data to be stored in the RAM memory
locations. The comparator in the BIST (built-in self-test) system take the data
from the RAM module and also directly from the input with the help of BIST
controller. After the comparison we get the output with respect to the inputs
of comparator and test the BIST RAM under the different advanced test cases.
The performance is measure in such a way the power consumption reduction, Area efficiency is
achieved.
MODULE 4: Design and analysis of Integration module
DESCRIPTION:
We are integrating all the
sub modules and output signals are routed into the required ports as per the
FPGA device.
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