VLSI Projects in Chennai
VLSI PROJECTS – IEEE 2017
·
Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space
Compaction Environment
·
TM-RF: Aging-Aware Power-Efficient Register File Design for Modern
Microprocessors
·
A Fault Detection and Tolerance Architecture for Post-Silicon Skew Tuning
·
PAQCS: Physical Design-Aware Fault-Tolerant Quantum Circuit Synthesis
·
An MPCN-Based BCH Codec Architecture With Arbitrary Error Correcting
Capability
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An Efficient SRAM Yield Analysis and Optimization Method With Adaptive
Online Surrogate Modeling
·
New Analytic Model of Coupling and Substrate Capacitance in Nanometer
Technologies
·
A 110-nm CMOS 0.7-V Input Transient-Enhanced Digital Low-Dropout
Regulator With 99.98% Current Efficiency at 80-mA Load
·
Multicore SIMD ASIP for Next-Generation Sequencing and Alignment Biochip
Platforms
·
An 8-bit 0.35-V 5.04-fJ/Conversion-Step SAR ADC With Background
Self-Calibration of Comparator Offset
·
A Holistic Analysis of Circuit Performance Variations in 3-D ICs With
Thermal and TSV-Induced Stress Considerations
·
On the Efficacy of Through-Silicon-Via Inductors
·
Direct Period Synthesis for Achieving Sub-PPM Frequency Resolution
Through Time Average Frequency: The Principle, The Experimental Demonstration,
and Its Application in Digital Communication
·
Background Digital Calibration of Comparator Offsets in Pipeline ADCs
·
A High-Performance On-Chip Bus (MSBUS) Design and Verification
·
VLSI Design for SVM-Based Speaker Verification System
·
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of
NBTI and PBTI in High-k/Metal Gate Technology
·
Design and Analysis of Highly Energy/Area-Efficient Multiported Register
Files With Read Word-Line Sharing Strategy in 65-nm CMOS Process
·
Trip-Point Bit-Line Precharge Sensing Scheme for Single-Ended SRAM
·
A Semiblind Digital-Domain Calibration of Pipelined A/D Converters via
Convex Optimization
·
Corrections to “Super Fast Physics-Based Methodology for Accurate Memory
Yield Prediction”
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